X-ray detector / silicon drift

Launched in August 2012, the new X-MaxN range of Silicon Drift Detector exploits a new sensor chips, new electronics, and innovative packaging to deliver a truly next generation SDD performance.

The X-MaxN Silicon Drift Detector comes in a range of detector sizes, from 20 mm2 for microanalysis up to an astounding 150 mm2 for advanced nanoanalysis. The latter is the largest SDD in the market and delivers more than double the speed of any other detector.

Overview
A range of silicon drift detector sizes, from 150 mm2 to 20 mm2
X-MaxN provides a superb resolution that is independent of sensor size - specifications guaranteed to ISO15632:2012
The same mechanical geometry inside the microscope means that the count rate simply increases in proportion to sensor size
Excellent low energy analysis, including Be detection guaranteed on all sensor sizes
Fits to SEMs and FIBs using the same interface as the previous generation X-Max
Up to four X-MaxN can run in parallel on one microscope to create a system with a total active area of 600 mm2